Data di Pubblicazione:
2000
Abstract:
The BaBar Silicon Vertex Tracker (SVT) is designed to provide the high-precision vertexing necessary for making measurements of CP violation at the SLAG B-Factory PEP-II. The instrument consists of five layers of double-sided silicon strip detectors and has been installed in the BaBar experiment and taking colliding beam data since May 1999. An overview of the design as well as performance and experience from the initial running will be presented. (C) 2000 Published by Elsevier Science B.V. All rights reserved.
Tipologia CRIS:
03A-Articolo su Rivista
Elenco autori:
C. Bozzi;V. Carassiti;A. C. Ramusino;S. Dittongo;M. Folegani;L. Piemontese;B. K. Abbott;A. B. Breon;A. R. Clark;S. Dow;Q. Fan;F. Goozen;C. Hernikl;A. Karcher;L. T. Kerth;I. Kipnis;S. Kluth;G. Lynch;M. Levi;P. Luft;L. Luo;M. Nyman;M. Pedrali-Noy;N. A. Roe;G. Zizka;D. Roberts;D. Barni;E. Brenna;I. Defendi;A. Forti;D. Giugni;F. Lanni;F. Palombo;V. Vaniev;A. Leona;E. Mandelli;P. F. Manfredi;A. Perazzo;V. Re;C. Angelini;G. Batignani;S. Bettarini;M. Bondioli;F. Bosi;G. Calderini;M. Carpinelli;F. Dutra;F. Forti;D. Gagliardi;M. A. Giorgi;A. Lusiani;P. Mammini;M. Morganti;F. Morsani;E. Paoloni;A. Profeti;M. Rama;G. Rampino;G. Rizzo;F. Sandrelli;G. Simi;G. Triggiani;S. Tritto;R. Vitale;P. Burchat;C. Cheng;D. Kirkby;T. Meyer;C. Roat;M. Bona;F. Bianchi;F. Daudo;B. D. Girolamo;D. Gamba;G. Giraudo;P. Grosso;A. Romero;A. Smol;P. Trapani;D. Zanin;L. Bosisio;G. D. Ricca;L. Lanceri;A. Pompili;P. Poropat;M. Prest;C. Rastelli;E. Vallazza;G. Vuagnin;C. Hast;E. P. Potter;V. Sharma;S. Burke;D. Callahan;C. Campagnari;B. Dahmes;A. Eppich;D. Hale;K. Hall;P. Hart;N. Kuznetsova;S. Kyre;S. Levy;O. Long;J. May;J. Richman;W. Verkerke;M. Witherell;J. Beringer;A. M. Eisner;A. Frey;A. Grillo;M. Grothe;R. Johnson;E. Spencer;M. Turri;M. Wilder;E. Charles;P. Elmer;J. Nielsen;W. Orejudos;I. Scott;J. Walsh;H. Zobernig
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