Measurement of the branching ratios of the decays Xi0 ---> Sigma+ e- anti-nu(e) and anti-Xi0 ---> anti-Sigma+ e+ nu(e)
Articolo
Data di Pubblicazione:
2007
Abstract:
From 56 days of data taking in 2002, the NA48/1 experiment observed 6316 Ξ 0 → Σ + e − ν ¯ e candidates (with the subsequent Σ + → p π 0 decay) and 555 Ξ 0 ¯ → Σ + ¯ e + ν e candidates with background contamination of 215 ± 44 and 136 ± 8 events, respectively. From these samples, the branching ratios BR ( Ξ 0 → Σ + e − ν ¯ e ) = ( 2.51 ± 0.03 stat ± 0.09 syst ) × 10 −4 and BR ( Ξ 0 ¯ → Σ + ¯ e + ν e ) = ( 2.55 ± 0.14 stat ± 0.10 syst ) × 10 −4 were measured allowing the determination of the CKM matrix element | V us | = 0.209 −0.028 +0.023 . Using the Particle Data Group average for | V us | obtained in semileptonic kaon decays, we measured the ratio g 1 / f 1 = 1.20 ± 0.05 of the axial-vector to vector form factors.
Tipologia CRIS:
03A-Articolo su Rivista
Elenco autori:
J. Batley;G. Kalmus;C. Lazzeroni;D. Munday;M. Patel;M. Slater;S. Wotton;R. Arcidiacono;G. Bocquet;A. Ceccucci;D. Cundy;N. Doble;V. Falaleev;L. Gatignon;A. Gonidec;P. Grafström;W. Kubischta;F. Marchetto;I. Mikulec;A. Norton;B. Panzer-Steindel;P. Rubin;H. Wahl;E. Goudzovski;P. Hristov;V. Kekelidze;L. Litov;D. Madigozhin;N. Molokanova;Y. Potrebenikov;S. Stoynev;A. Zinchenko;E. Monnier;E. Swallow;R. Winston;R. Sacco;A. Walker;W. Baldini;P. Dalpiaz;P. Frabetti;A. Gianoli;M. Martini;F. Petrucci;M. Scarpa;M. Savrié;A. Bizzeti;M. Calvetti;G. Collazuol;E. Iacopini;M. Lenti;G. Ruggiero;M. Veltri;M. Behler;K. Eppard;M. Eppard;A. Hirstius;K. Kleinknecht;U. Koch;L. Masetti;P. Marouelli;U. Moosbrugger;C. M. Morales;A. Peters;R. Wanke;A. Winhart;A. Dabrowski;T. F. Martin;M. Velasco;G. Anzivino;P. Cenci;E. Imbergamo;G. Lamanna;P. Lubrano;A. Michetti;A. Nappi;M. Pepe;M. Petrucci;M. Piccini;M. Valdata;C. Cerri;F. Costantini;R. Fantechi;L. Fiorini;S. Giudici;I. Mannelli;G. Pierazzini;M. Sozzi;C. Cheshkov;J. Cheze;M. D. Beer;P. Debu;G. Gouge;G. Marel;E. Mazzucato;B. Peyaud;B. Vallage;M. Holder;A. Maier;M. Ziolkowski;C. Biino;N. Cartiglia;M. Clemencic;S. G. Lopez;E. Menichetti;N. Pastrone;W. Wislicki;H. Dibon;M. Jeitler;M. Markytan;G. Neuhofer;L. Widhalm
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