Data di Pubblicazione:
2024
Abstract:
In this study, we inspect and analyse the effect of Al implantation into AlN by conducting confocal microscopy on the ion implanted regions, before and after implantation, followed by an annealing step. The independent effect of annealing is studied in an unimplanted control region, which showed that annealing alone does not produce new emitters. Through tracking individual locations in a lithographically patterned sample, we observe that point-like emitters are created in the implanted regions after annealing. The newly created quantum emitters show anti-bunching under ambient conditions and are spectrally similar to the previously discovered emitters in as-grown AlN
Tipologia CRIS:
03A-Articolo su Rivista
Keywords:
Single-photon emitter, Aluminium nitride, Ion implantation, Colour centre
Elenco autori:
Yağcı, H.B.; Nieto Hernandez, E.; Cannon, J.K.; Bishop, S.G.; Corte, E.; Hadden, J.P.; Olivero, P.; Forneris, J.; Bennett, A.J.
Link alla scheda completa:
Link al Full Text:
Pubblicato in: