Digital pixel test structures implemented in a 65 nm CMOS process

Aglieri Rinella, Gianluca; Andronic, Anton; Antonelli, Matias; Aresti, Mauro; Baccomi, Roberto; Becht, Pascal; Beole, Stefania; Braach, Justus; Buckland, Matthew Daniel; Buschmann, Eric; Camerini, Paolo; Carnesecchi, Francesca; Cecconi, Leonardo; Charbon, Edoardo; Contin, Giacomo; Dannheim, Dominik; de Melo, Joao; Deng, Wenjing; di Mauro, Antonello; Hasenbichler, Jan; Hillemanns, Hartmut; Hong, Geun Hee; Isakov, Artem; Junique, Antoine; Kluge, Alex; Kotliarov, Artem; Křížek, Filip; Lautner, Lukas; Mager, Magnus; Marras, Davide; Martinengo, Paolo; Masciocchi, Silvia; Menzel, Marius Wilm; Munker, Magdalena; Piro, Francesco; Rachevski, Alexandre; Rebane, Karoliina; Reidt, Felix; Russo, Roberto; Sanna, Isabella; Sarritzu, Valerio; Senyukov, Serhiy; Snoeys, Walter; Sonneveld, Jory; Šuljić, Miljenko; Svihra, Peter; Tiltmann, Nicolas; Usai, Gianluca; Van Beelen, Jacob Bastiaan; Vassilev, Mirella Dimitrova; Vernieri, Caterina; Villani, Anna