Data di Pubblicazione:
2022
Abstract:
Diamond is used as detector material in high energy physics experiments due to
its inherent radiation tolerance. The RD42 collaboration has measured the radiation tolerance
of chemical vapour deposition (CVD) diamond against proton, pion, and neutron irradiation.
Results of this study are summarized in this article. The radiation tolerance of diamond detectors
can be further enhanced by using a 3D electrode geometry. We present preliminary results of a
poly-crystalline CVD (pCVD) diamond detector with a 3D electrode geometry after irradiation
and compare to planar devices of roughly the same thickness.
Tipologia CRIS:
03A-Articolo su Rivista
Keywords:
diamond, detector, radiation tolerance
Elenco autori:
Bäni, L; Artuso, M; Bachmair, F; Bartosik, M; Beck, H; Bellini, V; Belyaev, V; Bentele, B; Bergonzo, P; Bes, A; Brom, J-M; Chiodini, G; Chren, D; Cindro, V; Claus, G; Collot, J; Cumalat, J; Curtoni, S; Dabrowski, A; D'Alessandro, R; Dauvergne, D; de Boer, W; Dorfer, C; Dünser, M; Eigen, G; Eremin, V; Forneris, J; Gallin-Martel, L; Gallin-Martel, M-L; Gan, K K; Gastal, M; Ghimouz, A; Goffe, M; Goldstein, J; Golubev, A; Gorišek, A; Grigoriev, E; Grosse-Knetter, J; Grummer, A; Hiti, B; Hits, D; Hoeferkamp, M; Hofmann, T; Hosselet, J; Hügging, F; Hutson, C; Jackman, R; Janssen, J; Jennings-Moors, R; Kagan, H; Kanxheri, K; Kis, M; Kramberger, G; Kuleshov, S; Lacoste, A; Lagomarsino, S; Giudice, A Lo; Paz, I López; Lukosi, E; Maazouzi, C; Mandić, I; Marcatili, S; Marino, A; Mathieu, C; Menichelli, M; Mikuž, M; Morozzi, A; Moscatelli, F; Moss, J; Mountain, R; Oh, A; Olivero, P; Pakpour-Tabrizi, A; Passeri, D; Pernegger, H; Perrino, R; Picollo, F; Pomorski, M; Porter, A; Potenza, R; Quadt, A; Rarbi, F; Re, A; Reichmann, M; Roe, S; Rossetto, O; Becerra, D A Sanz; Schmidt, C; Schnetzer, S; Sciortino, S; Scorzoni, A; Seidel, S; Servoli, L; Smith, D S; Sopko, B; Sopko, V; Spagnolo, S; Spanier, S; Stenson, K; Stone, R; Stugu, B; Sutera, C; Traeger, M; Trischuk, W; Truccato, M; Tuvê, C; Velthuis, J; Wagner, S; Wallny, R; Wang, J C; Welch, J; Wermes, N; Wickramasinghe, J; Yamouni, M; Zalieckas, J; Zavrtanik, M
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